FEI Quanta 3D FEG Scanning Electron Microscope w/ Focused Ion Beam (FIB) Lab

This item is sold on behalf of a client where it will be removed from a lab where it is surplus to requirements.

It is in very good cosmetic condition and in complete working order.

Model: FEI Quanta 3D FEG Scanning Electron Microscope with Focused Ion Beam (FIB) Cross Sectioning Capability

Year of Manufacture: 2008 (fully repaired and recommissioned by ThermoFisher in 2021, with FEG electron source replaced by ThermoFisher in 2022)

Serial Number: IR77/D927A

The FEG source was replaced by ThermoFisher in 2022.

Key Features:

• Dual-Beam System: Combines high-resolution SEM and FIB in one platform.
• Resolution: Up to 1.2 nm (electron) and 7 nm (ion).
• High-Brightness Sources: Electron and gallium liquid-metal ion sources.
• Flexible Vacuum Modes: Includes Environmental SEM (ESEM) for non-conductive/sensitive samples.
• Gas Injection System: For deposition and etching applications.
• Motorised 5-Axis Stage: For versatile sample positioning.
• Carbon Milling Capability: Supports advanced sample preparation.
• Digital Imaging Integration: High-quality imaging with optional functionality.
• Ancillary Equipment: Includes power supply, pumps, chiller, and accessories.

Ideal Applications:

• Materials science
• Electronics
• Nanotechnology research
• Industrial failure analysis

This FEI Quanta 3D FEG provides comprehensive imaging, milling, and cross-sectioning tools, suitable for both research and industrial use.

It is available for collection from York, UK. Shipping may be arranged for an additional fee.

Please Note: The normal terms and conditions do not apply to this item. It is non-returnable and non-refundable.