Scanning Electron Microscopes (SEM)

Hitachi S-2600N Scanning Electron Microscope with Oxford X-Max 50 mm² INCA Detector

This system was removed from a facility where it was surplus to requirement.

The system is reported to be in good working order and was in active use prior to removal.

This Hitachi S-2600N SEM is fitted with an Oxford Instruments X-Max 50 mm² INCA detector system. According to the previous owner, the instrument has been serviced every 6 months due to strict UKAS operational standards, although annual servicing is generally considered standard practice within the industry. Service records from the last service carried out in August 2025 may be available.

Main System

Hitachi S-2600N Scanning Electron Microscope

Model: S-2600N

S/N: 1512-01

Included Accessories & Equipment

Applied Thermal Control Chiller

Model: ATC K1

S/N: 030011

Canatron Transformer

Model: EN 60742

S/N: 24777/4

ULVAC Vacuum Pump

Model: GLD-137CC

S/N: 2160817

ULVAC Vacuum Pump

Model: GLD-136B

S/N: 0216162

Oxford INCA mics2

Model: INCA mics2

S/N: 074DC 12-09

Oxford INCA x-stream2

Model: INCA x-stream2

S/N: 0744C 12-09

2x HP PCs complete with monitors, keyboards and mice

Manuals & Documentation

2x Hitachi S-2600N Training Packs

2x Hitachi Model S-2600N Scanning Electron Microscope Instruction Manuals

2x Hitachi Instruction Manual – Hi-Mouse Version 4

Software Included

Oxford INCA Install Media Issue 5

Oxford INCA Feature Training Manual Ver. 1.03.07

Oxford XMax Support Software Issue 1.1

Oxford The Microanalysis Suite Issue 18c

Thermo Electron Microlab 350 Scanning Auger Microprobe System w/ 5kV GaFIB & EDS

This system is sold on behalf of a client where it will be removed from a University Lab where it is surplus to requirements.

It features an ultra-high vacuum chamber rated to 10⁻⁹ mbar and uses a field-emission electron beam to generate Auger electrons for detailed surface analysis.

The system includes a 5 kV Gallium focused ion beam (FIB) and energy-dispersive X-ray spectroscopy (EDS) capabilities. Control modules and associated hardware are supplied.

The system comprises the following:

• Ultra-high vacuum chamber rated to 10⁻⁹ mbar
• Field emission gun for electron beam scanning and Auger electron generation
• 5 kV Gallium FIB capability
• EDS detector and control hardware
• Control modules (as supplied with the system)

Utilities and site requirements:

• Three-phase power supply
• Nitrogen gas line
• Argon gas line

The normal terms and conditions do not apply to this item. This item is non returnable and non refundable.

JEOL Neoscope JCM-5000 Scanning Electron Microscope (SEM)

This system was removed from a university laboratory where it was surplus to requirements.

The unit powers on successfully, and all components appear complete and in good overall condition.

Please note: we have not been able to test the system further, as the required PC and software are not included.

According to the previous owner, the SEM was fully operational prior to removal. However, the Deben Coolstage had not been used for some time, and its current functionality is therefore unverified.

Included Components:

• Deben Coolstage with specimen block, holder, and controller
• Oil vacuum pump
• Deben JCM-5000
• Deben Chamberscope power supply
• JCM-5000 Digest Operation Manual
• Coolstage Specimen Cooling Unit Operation Manual (LT3.05)
• Original manufacturer binder (2009) containing instructions

Hitachi S4000 Microscope (SEM) Scanning Electron Microscope Lab

This system was removed from a university laboratory where it was surplus to requirements.

It is in good cosmetic condition. Unfortunately, we are unable to power it on or test it further on site.

According to the previous owner, this system was serviced until 2022 and was operational prior to decommissioning.

Oxford Instruments INCA X-Stream & INCA MICS Microanalysis System Lab

This item was removed from a facility where it was surplus to requirements.

The system is in good cosmetic condition.

Both units power on (tested using an in-house 24 VDC PSU).

Included Components

Oxford Instruments INCA X-Stream

• Assy: 51-1100-103
• Serial No: 04278
• Date Code: 04-07
• Powers on (tested with 24 VDC PSU)

Oxford Instruments INCA MICS

• Assy: 51-G-1100-119
• Serial No: 04590
• Date Code: 07-07
• Powers on (tested with 24 VDC PSU)

Software Media Included

• INCA Install Media
• INCA Crystal Training Material
• The Microanalysis Suite
• AZtec Issue 4.2 SP1
• Channel 5 Service Pack 10

Manuals Included

• Customer Training at Installation Time – CSG WIN 11-01

Deben Cool Stage LEO-1400VP for Scanning Electron Microscope Lab

This item was removed from a facility where it was surplus to requirement.

It is in good cosmetic condition and in good working order.

This item was removed from a ZEISS SUPRA 55 Scanning Electron Microscope systen. it was working when last used.

This item is new in stock. Please enquire for further details.

Tescan Vega 2 LMU Scanning Electron Microscope System w/ 2 PCs

This system was removed from a facility where it was surplus to requirement.

The previous owner advised that the system was installed and running prior to removal.

The main SEM is a Tescan Vega 2 LMU, manufactured in 2008, and is configured for high-resolution scanning electron microscopy and microanalysis.

The previous owner advised that the Tescan software and detectors were verified as operational under Windows XP prior to removal.

Please note that the PC hard drives have been wiped. The system includes discs for Windows XP and the Tescan software. No licence dongles were used

with the system according to the previous owner.

A disc for the Oxford INCA EDX software is not included.

Please note that the transport wheels are currently fitted to the main system table. The side panels cannot be refitted while these wheels are installed. Due to the weight of the table and the length of the wheel fixings, the wheels were not removed during inspection, so the unit is shown in the images without the side panels fitted.

Main System Features:

• Tungsten thermionic electron source
• Acceleration voltage: 200 V – 30 kV
• Beam current: up to approximately 2 µA
• Continuously variable probe current control
• Resolution:
• Approx. 3.5 nm at 30 kV in SE mode
• Approx. 4.5 nm at 30 kV in BSE mode

Detectors & Imaging:

• LVST low-vacuum secondary electron detector
• 4-quadrant semiconductor BSE detector
• Chamber view camera
• Oxford Instruments INCA 250 XT EDX system
• INCA x-act PentaFET Precision detector
• Model: 51-ADD0048
• Sensor: 51-1385-005
• Resolution at 5.9 keV: 133 eV

Stage:

• Motorised stage with rotation and tilt
• Accommodates up to 7 sample stubs

Software / PC Systems:

• Tescan software V3.4.2.1
• Oxford INCA Suite V4.12
• 2x PC systems
• Windows XP operating environment

Accessories Include:

• Trackball control
• Standard vacuum components
• PC control systems
• Associated system accessories as shown

Please review the images carefully for the overall condition, configuration, software media, accessories and exact contents included.