This item is being sold on behalf of one of our clients and is not held in our own stock.

Please enquire with us if you would like to buy this item as shipping, warranty and the terms and conditions of sale will be dependent on the client's needs.

JEOL JSM-7200F Field Emission Scanning Electron Microscope (FE-SEM) with AZtec EDX, EBSD & STEM Detector – Under Service Contract

This system is being offered for sale on behalf of a client.

The JEOL JSM-7200F is a high-end field emission scanning electron microscope (FE-SEM), designed for ultra-high resolution imaging and advanced analytical capabilities. This model is regarded as a premium platform within the SEM market, particularly suited to materials science, nanotechnology, and advanced microscopy applications.

The system is equipped with Oxford Instruments AZtec analytical systems, enabling comprehensive compositional and crystallographic analysis, alongside STEM capability for transmission-based imaging.

Key information:

• High-resolution surface imaging using field emission source
• Elemental analysis via EDX
• Crystallographic orientation mapping via EBSD
• Scanning Transmission Electron Microscopy (STEM) functionality
• Advanced analytical workflows through AZtec software suite
• Service History & Condition
• Installed circa 2018–2019
• Currently in working condition
• Maintained under a current annual service contract with JEOL UK
• Last serviced in 2025
• System has remained in operational use within a controlled university environment

Included Equipment

• JEOL JSM-7200F FE-SEM system
• Oxford Instruments AZtec EDX system
• Oxford Instruments AZtec EBSD system
• STEM stage and detector