Thermo Electron Microlab 350 Scanning Auger Microprobe System w/ 5kV GaFIB & EDS

This system is sold on behalf of a client where it will be removed from a University Lab where it is surplus to requirements.

It features an ultra-high vacuum chamber rated to 10⁻⁹ mbar and uses a field-emission electron beam to generate Auger electrons for detailed surface analysis.

The system includes a 5 kV Gallium focused ion beam (FIB) and energy-dispersive X-ray spectroscopy (EDS) capabilities. Control modules and associated hardware are supplied.

The system comprises the following:

• Ultra-high vacuum chamber rated to 10⁻⁹ mbar
• Field emission gun for electron beam scanning and Auger electron generation
• 5 kV Gallium FIB capability
• EDS detector and control hardware
• Control modules (as supplied with the system)

Utilities and site requirements:

• Three-phase power supply
• Nitrogen gas line
• Argon gas line

The normal terms and conditions do not apply to this item. This item is non returnable and non refundable.

Hitachi S-4800 Field Emission Scanning Electron Microscope with Oxford Ultim Max 40 EDS

This item is sold on behalf of a client, where it will be removed from a laboratory in which it is surplus to requirements.

The system has been regularly serviced and was last visited by Hitachi in February 2025. It has seen little use since that service and is currently installed, powered, and imaging correctly. Hitachi involvement is expected for decommissioning and recommissioning at a new site, and the system is therefore offered on the basis that standard service/commissioning work at the buyer’s cost will be required as part of relocation.

System Overview

• Model: Hitachi S-4800 Field Emission Scanning Electron Microscope (FE-SEM)
• Stage: Type 2 motorised stage (installed c.2008)
• Control PC & Software: Windows 10 PC with PC-SEM (installed 2021)
• EDS System: Oxford Instruments Ultim Max 40 EDS (purchased 2024) with dedicated PC and analysis software
• Service History: Regular preventative maintenance by Hitachi from 2021–2025 (approx. every six months plus ad-hoc visits)
• Last Service: 4–5 February 2025 – 2-day preventative maintenance visit including column bake-out and image stability checks

Oxford Instruments have confirmed that EDS ownership transfer is straightforward, and they do not charge for transferring registration to the new owner.

Key Features

• High-resolution field emission SEM suitable for advanced materials characterisation
• Type 2 motorised stage for flexible sample positioning
• 5-channel solid state backscattered electron (BSE) detector
• Transmitted electron detector
• Ion pump backup power supply
• Modern Windows 10 control PC with PC-SEM software (2021)
• Oxford Ultim Max 40 EDS detector (2024) with dedicated PC and analysis software
• Includes compressor, scroll pump and chiller required for operation (as stated by the seller)

Condition & Status

• Historically well maintained with regular Hitachi preventative maintenance
• Last serviced February 2025 and lightly used since
• Currently installed, powered, and imaging correctly
• System has not yet been decommissioned
• Hitachi involvement is expected for disassembly, packing and recommissioning during relocation
• Contamination & Use History
• Open-access instrument used predominantly for metal and ceramic powders
• External surfaces can be cleaned by the seller prior to removal
• Column routinely baked out during service visits; chamber cleaned as required by service engineers

Included With This System

• Hitachi S-4800 FE-SEM with type 2 motorised stage
• Windows 10 control PC with PC-SEM software (installed 2021)
• Oxford Instruments Ultim Max 40 EDS detector (2024) with dedicated PC and EDS software
• 5-channel solid state BSE detector
• Transmitted electron detector
• Ion pump backup power supply
• Compressor, scroll pump and chiller
• Associated cables and connections present at the time of collection

Logistics & Responsibilities

The system is still installed.

Decommissioning, disassembly, packaging, transport and recommissioning are not included and must be arranged and funded by the buyer.

The seller advises that the system originally arrived in multiple containers and was assembled by Hitachi; a similar process is expected for removal and reinstallation.

Location: Farnborough, Hampshire, UK.

Oxford Instruments INCAx-Act Energy Dispersive Spectrometer System

This system was removed from a university where it was surplus to requirement.

It powers on and is in good cosmetic condition, we are unable to test it further at our facility.

It was removed from a Philips XL30 SEM TMP system that was faulty, though we were informed that this was still working.

Includes:

• INCAx-act
• Model: 51-ADD0082
• Sensor: 51-1385-046

• INCA MICSF+
• ASSY: 51-G-1100-149

• INCA x-stream 2
• ASSY: 51-G-1100-131
• Unit has been powered up with the included PSU.

• 4 x PCI Interface Cards
• Presumed to have been removed from the controlling PC, includes various corresponding cables.

• Manual & Software Materials
• Oxford Instruments 'The Principles and Practice of X-ray Microanalysis' CD Rom Discs.
• INCA Binder with INCA Install Media Issue 5, The Microanalysis Suite Discs 1 & 2, Keys & Drivers, and 2 x USB System Recovery Pen Drives.

JEOL Neoscope JCM-5000 Scanning Electron Microscope (SEM) with PC and Accessories

This system was removed from a university laboratory where it was surplus to requirements.

The unit powers on successfully, and all components appear complete and in good overall condition.

Please note: we have not been able to test the system further, as the required PC and software are not included.

According to the previous owner, the SEM was fully operational prior to removal. However, the Deben Coolstage had not been used for some time, and its current functionality is therefore unverified.

Included Components:

• Deben Coolstage with specimen block, holder, and controller
• Oil vacuum pump
• Deben JCM-5000
• Deben Chamberscope power supply
• JCM-5000 Digest Operation Manual
• Coolstage Specimen Cooling Unit Operation Manual (LT3.05)
• Original manufacturer binder (2009) containing instructions

Philips XL30SEM Environmental Scanning Electron Microscope ESEM

This item was removed from a university where it was surplus to requirement.

The system was in working order about 5 years ago, but has since required a new PC and has not been used.

There is no PC or Software included with this system.

It is in good cosmetic condition, with minor marks from use.

Item supplied with:

• BOC EDWARDS Turbomolecular Pump.              

Type: B753-01-991.                                            

Serial No: 016917679.                                        

• Sony Video Graphic Printer.                               

Type: UP-895CE.                                              

Serial No: 58728.

• High Temperature Stage Controller.                   

Type: 300-430-000.                                         

Serial No: 020501.                                            

• Philips Manual User Interface.

Type: 20445-C.

Serial No: 014203.

• NEC Multisync Monitor

Type: LCD1850E

Serial No: 202107890

• Caron Model: 2050W

Serial No: 091701-2915-03.

• Thermoelectric Stage Controller.

Type: 300-058-000.

Serial No: 011013.

This Hitachi S3000H SEM Scanning Electron Microscope is being sold on behalf of a laboratory. It is surplus to requirements.

The lab informed us that it was working when last used.

The microscope is from 1998, has one SE2 Detector.

Included are the following;

Hitachi S3000H SEM Scanning Electron Microscope Lab

Model: S-3000H

Date: 9/8/12

Part#: 50E-G386

Serial#: 1014-30

System specifications

- 0.3 - 30kV acceleration voltage range

- 5 nm resolution at 25kV in variable pressure mode

- 150mm diameter maximum specimen size

- Dual-bias for low voltage signal noise

- Backscatter mode

Canatron Transformers EN 60742 Transformer

Model: EN 60742

Serial#: CT6699

Hitachi CM751ET Monitor

Model: CM751ET

Serial#: G8E008620

Hitachi CM751ET Monitor

Model: CM751ET

Serial#: T9A 012253

Hitachi S3000H SEM Control Panel

Serial#: 1014-30

Edwards Oil Mist Filter EMF20

Serial#: A 462 29 000

Hitachi Measure Function Setup Disk V 01-05

Serial#: 50E-5497

Hitachi SEM Data Manager Setup Disk V 01-05

Serial#: 50E-5502

Hitachi S-3000Series V 10-16 CD Disc 1 & 2

Serial#: 50E-8108

Hitachi PC-SEM Restore CD Disc 1 & 2

Serial#: 1014-30

Adaptec SCSI Select v2.57.4 Floppy Disk

Serial#: 1492920-00

Adaptec AVA-2915LP/2930LP v1.13 Floppy Disk

Serial#: 1495022-00JA

HP Operating System DVD

Serial#: 483886-B21

Contec Drivers Software COM Setup Disk v.1.8

Serial# LYBM994

HP Compaq Business PC Documentation and Diagnostics DVD

Serial#: 490849-B21

HP Operating System DVD

Serial#: 394378-002

HP Operating System DVD

Serial# 486467-B22

HP Restore Plus! DVD

Serial#: 481206-B25

Roxio Creator Business 10 DVD

Serial#: 498164-B21

S300H Printed Circuit Board

Model S-3000H SEM Instruction Manual

Serial#: 50E-9247-9

Hitachi S-Type Filaments

Date: 08.06.201

Lot#: 0490228080

Serial#: 777-0179

Hitachi S4000 Microscope (SEM) Scanning Electron Microscope Lab

This system was removed from a university laboratory where it was surplus to requirements.

It is in good cosmetic condition. Unfortunately, we are unable to power it on or test it further on site.

According to the previous owner, this system was serviced until 2022 and was operational prior to decommissioning.

Gatan Mono CL SEM Detector Units with Princeton Pixis 100 Detector Camera

This system was removed from a university laboratory where it was surplus to requirements.

All units are in good cosmetic condition and power on, we are unable to conduct further testing at our facility.

The system comprises the following:

• Gratan Mono CL Detector Unit (Serial No. not present)
• Princeton Instruments Pixis 100 Detector Camera
• Model: 7515-0001
• Serial No.: 07040180003
• Princeton Instruments 12 Volt Power Supply
• Part No.: 4000-0052
• Serial No.: 04230594 0729
• Gatan Peltier Power Supply (Serial No. not present)
• Gatan Mono CL4 MRU (Manual Remote Unit) (Serial No. not present)
• Gatan 788 Digiscan II
• Model: 788.UK
• Serial No.: 08081302W0788
• Gatan PA4 Photo Amplifier (Serial No. not present)

Software Included:

• Microscopy Suite Ver 1.8 beta
• Microscopy Suite GMS 1.8.4
• System Response Files
• Stardock Mouselink
• Licenses Ver 1.6

Manuals Included:

• CD-R for Princeton Instruments Model 7515-0001
• Princeton Instruments Pixis user manual
• Mono CL4 operator's handbook

Additional Accessories:

• Mono CL4 cathodoluminescence mirror
• 39.5 cm detector connection shaft
• 7 data cables
• Gatan Digiscan differential converter
• 4 small blanking plates
• Gasket
• MCX-M to BNC-F adaptor (Part No. 6050-0540)

ISI ABT Scanning Electron Microscope (SEM) ABT-55

This was removed from a university lab where it was surplus to requirements. We are told it was in working order prior to being put into storage some time ago

Included are;

ISA ABT 55 Main Control Unit

With 25cm CRT monitor

Control desk with all control switches and buttons

Microscope ABT 55 Unit

Serial No. K244149

Year 1989

Controls for vacuum system, not included

ETP Sempra Robison Detector Head and Control Module

Model PSM-11-4

Serial No. 524

The main units were not powered up due to no plug on the main power supply unit, it was previously hard wired.

The Robinson Detector unit powered on and displayed readiness lights.

Accessories:

5 x used spare copper columns

4 x small aluminium fitting plates

Operators Manual

4 x 15 amp fuses

Filament cartridge

JEOL JSM 840A  SEM Scanning Electron Microscope System

This was removed from a university lab where it was surplus to requirements.

The lab confirmed it was in working order prior to removal, but the control panel was removed and sold separately. It has not been tested at all at our facility but it is in good cosmetic condition with marks from use.

Included are;

Main unit:

1 x JEOL JSM-840A Scanning Microscope

Model: JSM-840A

Serial#: EP130077

Item has attached:

1 x Oxford Instruments 6605

Serial#: 09091-3390-339-521

Power Supply Unit:

JEOL JSM-840A Main Power CSL

Model: JSM-840A Main Power CSL

Serial#: EP130077-40

Also included:

JEOL Pump

Model: N/A

Serial#: N/A

Good cosmetic condition.

Lx36Wx24Hx50cm

JEOL JSM-840A User Manual

JEOL JSM-840A Service Case

This contains:

JEOL Extender MP001569-01

Various washers, fixings, screws etc.

Deben Cool Stage LEO-1400VP for Scanning Electron Microscope Lab

This item was removed from a facility where it was surplus to requirement.

It is in good cosmetic condition and in good working order.

This item was removed from a ZEISS SUPRA 55 Scanning Electron Microscope systen. it was working when last used.

Cambridge Instruments Stereoscan 240 SEM Scanning Electron Microscope

This was removed from a university lab where it was surplus to requirements.

The working condition is unknown. It has been disassembled in storage for some time.

It is in good cosmetic condition with marks from use.

Included with it are;

Monitor & Keyboard.

Pfeiffer pump, Type TPH 170.

Pfeiffer power supply, Type TCP 300.

Some unidentifiable small parts.

Instruction manuals.